Badel, Xavier

Xavier Badel

Partner, European Patent Attorney, Authorised Swedish Patent Attorney, UPC Representative

Ph.D. Solid State Electronics

Xavier Badel is a certified European patent attorney specialising in the fields of telecommunications, high voltage power systems, semiconductor technology, optically based systems, positioning devices, infrared detectors, lighting devices, and materials science in general. His Ph.D. work was focused on the development of X-ray imaging detectors. Apart from patent procurement, Xavier represents also clients in opposition and appeal proceedings before the European Patent Office.

Contact information

PHONE

+46 8 440 95 70

MOBILE PHONE

+46 736 21 23 45

VISITING ADDRESS

Jakobsbergsgatan 36

111 44 Stockholm, Sweden

Practices

  • Analyses & searches
  • IP due diligence
  • IP Strategy
  • Litigation
  • Oppositions
  • Patents

Industries

  • Electronics
  • Manufacturing & process technology
  • Materials technology & nanotech
  • Medtech
  • Software & IT
  • Telecom

Languages

  • English
  • French
  • Swedish

Position

  • European Patent Attorney
  • Patent Attorney

Prior Experience

  • R&D engineer developing processes based on silicon technology for digital imaging detectors at the Royal Institute of Technology of Stockholm, 2005.

Education

  • M.Sc. Material Physics, National Institute of Applied Sciences of Lyon, France, 2000
  • Ph.D. Solid State Electronics, Royal Institute of Technology of Stockholm, Sweden (2005)

Authorisations

  • European Patent Attorney
  • Authorised Patent Attorney (Sweden)
  • Registered Representative before the Unified Patent Court (UPC)

Memberships

  • EPI (Institute of Professional Representatives before the European Patent Office)

Selected Publications

  • Electrochemical Etching of n-Type Silicon Based on Carrier Injection From a Back Side p-n Junction, Electrochemical and Solid State Letters 6, (6), C79-C81, 2003
  • Doping of Electrochemically Etched Pore Arrays in n-Type Silicon: Processing and Electrical Characterization, Journal of The Electrochemical Society, vol. 152, issue 4, 2005
  • Improvement of an X-ray imaging detector based on a scintillating guides screen, Nuclear Instr. and Meth. In Phys. Res. A 487, pp. 129-135, 2002